Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-19T19:29:10.299Z Has data issue: false hasContentIssue false
  • English
  • Français

Phase Identification of III-N Thin Films Grown by Molecular Beam Epitaxy and Migration Enhanced Epitaxy using Precession Electron Diffraction

Published online by Cambridge University Press:  04 August 2017

Eduardo Ortega ,
Y. L. Casallas-Moreno ,
M. Lopez-Lopez  and
Arturo Ponce
Eduardo Ortega
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, United States
Y. L. Casallas-Moreno
Affiliation:
Escuela Superior de Fisica y Matematicas, Instituto Politecnico Nacional (IPN), Ciudad de Mexico 07738, Mexico
M. Lopez-Lopez
Affiliation:
Physics Department, Centro de Investigacion y de Estudios Avanzados del IPN, Ciudad de Mexico 07360, Mexico.
Arturo Ponce
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1484 - 1485
Copyright
© Microscopy Society of America 2017 

References

[1] Nakamura, T., et al, Phys. Stat. Sol. (b) 243(7 2006 1451–1455.Google Scholar
[2] Casallas-Moreno, Y. L., et al, J. Appl. Phys 2013 113, 1.Google Scholar
[3] Ruiz-Zepeda, F., et al, Microsc. Res. Tech 2014 77, 980.Google Scholar
[4] The work was supported by SENER-CONACYT Project number 151076 and by the National Institute on Minority Health and Health Disparities of the NIH grant G12MD007591.Google Scholar