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Performance of a Silicon-Drift Detector in 200kV TEM Environments

Published online by Cambridge University Press:  26 July 2009

LF Allard  and
S Rozeveld
LF Allard
Affiliation:
Oak Ridge National Laboratory
S Rozeveld
Affiliation:
Dow Chemical Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 228 - 229
Copyright
Copyright © Microscopy Society of America 2009