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The authors thank Masashi Watanabe for the Digital Micrograph PCA plug-in. Research at ORNL was supported by the U.S. Department of Energy (DOE), Basic Energy Sciences (BES), Materials Sciences and Engineering Division, and through a user project supported by ORNL’s Center for Nanophase Materials CNMS) User Program, which is also sponsored by DOE-BES. Research at UCM was supported by the ERC starting Investigator Award, grant #239739 STEMOX and the Juan de la Cierva program. Research at UC Berkeley/LBNL and Stanford was supported by the Director, Office of Science, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Contract Numbers DE-AC02-05CH11231 and DE-SC0008505 respectively. Research at Vanderbilt was supported in part by the U.S DOE grant DE-FG02-09ER46554 and the McMinn Endowment.Computations were supported by the National Center for Supercomputing Applications (U.S. Department of Energy, contract no. DE-AC02-05CH11231). JG acknowledges support from the Spanish MEC 2007-0086. Work at UMN supported by NSF (DMR-0804432) and DOE (DE-FG02-06ER46275, specifically scattering characterization).