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Oxygen Annealing Driven Structural Evolution in PdCoO2 Films Through Electron Microscopy

Published online by Cambridge University Press:  30 July 2020

Debangshu Mukherjee
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Gaurab Rimal
Affiliation:
Rutgers University, Piscataway, New Jersey, United States
Raymond Unocic
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Ho-Nyung Lee
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Seongshik Oh
Affiliation:
Rutgers University, Piscataway, New Jersey, United States
Matthew Brahlek
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Advances in Electron Microscopy to Characterize Materials Embedded in Devices
Copyright
Copyright © Microscopy Society of America 2020

References

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Research supported by ORNL's Laboratory Directed Research and Development Program, which is managed by UT-Battelle, LLC for the U.S. Department of Energy (DOE). Electron microscopy was conducted as part of a user proposal at Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is a U.S. DOE Office of Science User Facility.Google Scholar