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Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis

  • David Rossouw (a1), Pierre Burdet (a1), Francisco de la Pena (a1), Caterina Ducati (a1), Benjamin R. Knappett (a2), Andrew E. H. Wheatley (a2) and Paul A. Midgley (a1)...
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References

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[1] Lucas, G., Burdet, P., Cantoni, M. & Hebert, C., Micron 52 (2013). p. 49.
[2] Jutten, C. & Herault, J., Signal Processing 24 (1991). p. 1.
[4] D.R. acknowledges support from the Royal Society's Newton International Fellowship scheme. B.R.K. thanks the UK EPSRC for financial support (EP/J500380/1). F.d.l.P. and C.D. acknowledge funding from the ERC under grant no. 259619 PHOTO EM. P.A.M and P.B. acknowledges financial support from the European Research Council under the European Union’s Seventh Framework Programme (FP7/2007-2013) / ERC grant agreement 291522-3DIMAGE. P.A.M. also acknowledges financial support from the European Union’s Seventh Framework Programme of the European Commission: ESTEEM2, contract number 312483.

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