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Optimized Damage-Reduction 60 keV Monochromated Electron Energy-Loss Spectroscopy Measurements of Optical Properties at the Donor/Acceptor Interface in Organic Photovoltaic Devices

  • Jessica A. Alexander (a1), Frank J. Scheltens (a1), Lawrence F. Drummy (a2), Michael F. Durstock (a2), James B. Gilchrist (a3), Sandrine E.M. Heutz (a3) and David W. McComb (a1)...
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      Optimized Damage-Reduction 60 keV Monochromated Electron Energy-Loss Spectroscopy Measurements of Optical Properties at the Donor/Acceptor Interface in Organic Photovoltaic Devices
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      Optimized Damage-Reduction 60 keV Monochromated Electron Energy-Loss Spectroscopy Measurements of Optical Properties at the Donor/Acceptor Interface in Organic Photovoltaic Devices
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References

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[1] Beljonne, D., et al., Chem. Mater 23 (2011) 591609.
[2] Pfannmoller, M., et al., Nano Lett 11 (2011) 30993107.
[3] van Bavel, S., et al., Macromolecules 42 (2009) 73967403.
[4] Chen, D., et al., Nano Lett 11 (2011) 561567.
[5] Egerton, R.F. in Electron Energy-Loss Spectroscopy in the Electron Microscope, Third Edition , (Springer, New York).
[6] Tompkins, H.G. & Irene, E.A. in Handbook of Ellipsometry. Springer (2005).
[7] The authors acknowledge the Air Force Office of Scientific Research and the Air Force Research Laboratory (AFRL) Materials and Manufacturing Directorate, the Dayton Area Graduate Studies Institute (DAGSI), and The Ohio State University for funding; Kurt Eynik and Luke Bissel from AFRL for technical support; and The Ohio State University Center for Electron Microscopy and Analysis for technical support.

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