Hostname: page-component-77c89778f8-9q27g Total loading time: 0 Render date: 2024-07-21T05:38:25.619Z Has data issue: false hasContentIssue false

Optimization of 3D EBSD in a FIB-SEM System Using a Static Sample Setup

Published online by Cambridge University Press:  23 September 2015

Julien Guyon
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux, LEM3, CNRS ISGMP, Universite de Lorraine, F-57045 Metz Cedex 01, France Laboratory of Excellence on Design of Alloy Metals for low-mAss Structures ('LabEx DAMAS'), Universite de Lorraine, France
Nathalie Gey
Affiliation:
Laboratoire d'Etude des Microstructures et de Mecanique des Materiaux, LEM3, CNRS ISGMP, Universite de Lorraine, F-57045 Metz Cedex 01, France Laboratory of Excellence on Design of Alloy Metals for low-mAss Structures ('LabEx DAMAS'), Universite de Lorraine, France
Daniel Goran
Affiliation:
Bruker Nano GmbH, Am Studio 2D, 12489 Berlin, Germany
Smail Chalal
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 56, 73447 Oberkochen, Germany
Fabian Perez-Willard
Affiliation:
Carl Zeiss Microscopy GmbH, Carl-Zeiss Str. 56, 73447 Oberkochen, Germany

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Uchic, M., et al, 1st International Conference on 3D Materials Science (2012) p. 195-202.Google Scholar
[2] Echlin, M. P., et al, Acta Mater 64 (2014). p. 307315.CrossRefGoogle Scholar
[3] Zaefferer, S. & Wright, S. I. in Electron Backscatter Diffraction in Materials Science (ed A. J. Schwartz et al (Springer (2009), p. 109122.CrossRefGoogle Scholar
[4] Donitz, D. & Wagner, Ch. US Patent US8901510 B2 (2014).Google Scholar
[5] Groeber, M. A. & Jackson, M. A., Integr. Mater. Manuf. Innov (2014) 3, 5.CrossRefGoogle Scholar