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Optical Spectroscopy Integrated with Environmental Scanning Transmission Electron Microscope: A Comprehensive In Situ Characterization Platform

Published online by Cambridge University Press:  27 August 2014

Matthieu Picher ,
Stefano Mazzucco ,
Steve Blankenship ,
Glenn Holland  and
Renu Sharma
Matthieu Picher
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203 Institute for Research in Electronics and Applied Physics, University of Maryland, College park, MD 20740
Stefano Mazzucco
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203
Steve Blankenship
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203
Glenn Holland
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203
Renu Sharma
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899-6203

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1748 - 1749
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Sharma, R., Mat., J. Res. (2005). 20, 1695.Google Scholar
[2] Hansen, , et al., Science (2001). 294, 1508.Google Scholar