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On Lensless Imaging of Organics with Neutrons, X-Rays, Helium Atoms and Low Energy Electrons: Damage and Iterative Phase Retrieval

Published online by Cambridge University Press:  02 July 2020

J.C.H. Spence ,
U. Weierstall  and
J. Fries
J.C.H. Spence
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ, 85287
U. Weierstall
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ, 85287
J. Fries
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ, 85287
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Abstract

Recent experiments with X-rays and high energy electrons have shown that image recovery from diffracted intensities is possible for non-periodic objects using iterative algorithms. Application of these methods to biological molecules raises the crucial problem of radiation damage, which may be quantified by Q = ΔE σi/σe, the amount of energy deposited by inelastic events per elastic event. Neutrons, helium atoms and low energy electrons below most ionization thresholds produce the smallest values of Q (see for TMV imaged at 60 eV). For neutrons (λ = 10-2Å, and deuterated, 15N-abelled molecules) Q is ∼3000 times smaller (∼50 times for λ = 1.8Å) than for electrons (80- 500keV) and about 4x 106 times smaller than for soft X-rays (1.5Å). Since σe for neutrons is about 105 times smaller than for electrons (and about 10 times smaller than for soft X-rays), a 105 times higher neutron dose is required to obtain the same S/N in a phase contrast image compared with electrons, if other noise sources are absent.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 268 - 269
Copyright
Copyright © Microscopy Society of America 2001

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References

1.Miao, J. et al., Nature 400 (1999) 342–344CrossRefGoogle Scholar
2.Weierstall, U. et al., submitted to Ultramic. 2000Google Scholar
3.Fienup, J.R., Applied Optics 21 (1982) 2758–2789CrossRefGoogle Scholar
4.Henderson, R., Quarterly Reviews of Biophysics 28 (1995) 171–193CrossRefGoogle Scholar
5.Weierstall, U., Spence, J.C.H., Stevens, M., Downing, K.H.. Micron 30(4) p.335–338 (1999)CrossRefGoogle Scholar
6.Bacon, G.E., Neutron scattering in chemistry, Butterworths, London (1977)Google Scholar
7.SNS website: WWW.sns.anl.govGoogle Scholar
8.Allman, B.E. et al., Nature 408 (2000) 158CrossRefGoogle Scholar
9.Fujiyoshi, Y. and Uyeda, N., Ultramic. 7 (1981) 189–192CrossRefGoogle Scholar
10.Pauli., H. “Atom, Molecule, and Cluster Beams I,” Springer, Berlin, (2000).CrossRefGoogle Scholar
11.Supported by ARO award DAAD190010500Google Scholar