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Microscopy and Microanalysis Microscopy and Microanalysis

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Novel, High Brightness X-ray Source and High Efficiency X-ray Optic for Development of X-ray Instrumentation

Published online by Cambridge University Press:  25 July 2016

Wenbing Yun ,
SH Lau ,
Benjamin Stripe ,
Alan Lyon ,
David Reynolds ,
Sylvia JY Lewis ,
Sharon Chen ,
Vladimir Semenov  and
Richard Ian Spink
Wenbing Yun
Affiliation:
Sigray, Inc. Concord, CAUSA
SH Lau
Affiliation:
Sigray, Inc. Concord, CAUSA
Benjamin Stripe
Affiliation:
Sigray, Inc. Concord, CAUSA
Alan Lyon
Affiliation:
Sigray, Inc. Concord, CAUSA
David Reynolds
Affiliation:
Sigray, Inc. Concord, CAUSA
Sylvia JY Lewis
Affiliation:
Sigray, Inc. Concord, CAUSA
Sharon Chen
Affiliation:
Sigray, Inc. Concord, CAUSA
Vladimir Semenov
Affiliation:
Sigray, Inc. Concord, CAUSA
Richard Ian Spink
Affiliation:
Sigray, Inc. Concord, CAUSA
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Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 118 - 119
Copyright
© Microscopy Society of America 2016 

References

[1] Skarzynski, T Acta Crystallographica Section D (2013).Google Scholar
[2] Tsuji, , et al, Spectrochemica Acta Part B: Atomic Spectroscopy (2015).Google Scholar
[3] Cole, MT, et al., Nanotechnology 27 (2016).Google Scholar
[4] The authors acknowledge funding from the NSF, Division of Industrial Innovation & Partnerships for the development of x-ray mirror lens (IIP-1448727) and the NIH, National Institute of General Medicine Science for the development of the microstructured source target (GRANT11545218).Google Scholar
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