Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-23T20:49:53.112Z Has data issue: false hasContentIssue false
  • English
  • Français

Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python.

Published online by Cambridge University Press:  05 August 2019

Chris Meyer ,
Niklas Dellby ,
Jordan A. Hachtel ,
Tracy Lovejoy ,
Andreas Mittelberger  and
Ondrej Krivanek
Chris Meyer*
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Niklas Dellby
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Jordan A. Hachtel
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37830, USA
Tracy Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Andreas Mittelberger
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Ondrej Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA Department of Physics, Arizona State University, Tempe, AZ 85287, USA
*
*Corresponding author: cmeyer@nion.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 122 - 123
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Meyer, C.E. et al. , Microsc. Microanal. 20 (Suppl 3, 2014) 1108-1109.Google Scholar
[2]Pennington, R.S., Wang, F. and Koch, C.T., Ultramicroscopy 141 (2014) 32-37.Google Scholar
[3]http://nion.com/swiftGoogle Scholar