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New Technique for Imaging Geologic Materials via Integrated Correlative Light and Electron Microscopy (iCLEM)

Published online by Cambridge University Press:  04 August 2017

Paul C. Hackley ,
Brett J. Valentine ,
Daan van Oosten Slingeland ,
Lennard Voortman  and
Javin Hatcherian
Paul C. Hackley
Affiliation:
U.S. Geological Survey, Reston VA 20192, United States
Brett J. Valentine
Affiliation:
U.S. Geological Survey, Reston VA 20192, United States
Daan van Oosten Slingeland
Affiliation:
Delmic BV, The Netherlands
Lennard Voortman
Affiliation:
Delmic BV, The Netherlands
Javin Hatcherian
Affiliation:
U.S. Geological Survey, Reston VA 20192, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2112 - 2113
Copyright
© Microscopy Society of America 2017 

References

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