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New Method of Transmission Electron Diffraction to Characterize Nanomaterials in the SEM

Published online by Cambridge University Press:  08 April 2017

R Geiss ,
R Keller ,
S Sitzman  and
P Rice
R Geiss
Affiliation:
National Institute of Standards and Technology
R Keller
Affiliation:
National Institute of Standards and Technology
S Sitzman
Affiliation:
Oxford Instruments
P Rice
Affiliation:
University of Colorado Boulder

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 386 - 387
Copyright
Copyright © Microscopy Society of America 2011