Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
Home
Hostname: page-component-684899dbb8-pcn4s Total loading time: 0.256 Render date: 2022-05-21T04:03:17.446Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "useRatesEcommerce": false, "useNewApi": true }
  • English
Microscopy and Microanalysis Microscopy and Microanalysis

Article contents

New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE

Published online by Cambridge University Press:  25 July 2016

Matthew R. Linford ,
Bhupinder Singh ,
Daniel Velázquez ,
Jeff Terry ,
Jacob D. Bagley ,
Dennis H. Tolley ,
Anubhav Diwan ,
Varun Jain  and
Alberto Herrera-Gomez
Matthew R. Linford
Affiliation:
Departments of Chemistry and Biochemistry and
Bhupinder Singh
Affiliation:
Departments of Chemistry and Biochemistry and
Daniel Velázquez
Affiliation:
Statistics, Brigham Young University, UT, USA
Jeff Terry
Affiliation:
Statistics, Brigham Young University, UT, USA
Jacob D. Bagley
Affiliation:
Departments of Chemistry and Biochemistry and
Dennis H. Tolley
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico
Anubhav Diwan
Affiliation:
Departments of Chemistry and Biochemistry and
Varun Jain
Affiliation:
Departments of Chemistry and Biochemistry and
Alberto Herrera-Gomez
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico
Rights & Permissions[Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 344 - 345
Copyright
© Microscopy Society of America 2016 

References

[1] Singh, B, Diwan, A, Jain, V, Herrera-Gomez, A, Terry, J & Linford, MR Submitted to Applied Surface Science.Google Scholar
[2] Singh, B, Velázquez, D, Terry, J & Linford, MR J. Electron Spectrosc 197 (2014) 56–63.CrossRefGoogle Scholar
[3] Singh, B, Velázquez, D, Terry, J & Linford, MR J. Electron Spectrosc 197 (2014) 112–117.CrossRefGoogle Scholar
[4] Bagley, JD, Tolley, DH & Linford, MR Surface and Interface Analysis (2016), DOI: 10.1002/sia.5938.Google Scholar
[5] Hilfiker, JN, Singh, N, Tiwald, T, Convey, D, Smith, SM, Baker, JH & Tompkins, HG Thin Solid Films 516 (2008) 7979–7989.CrossRefGoogle Scholar
[6] Powell, CJ J. Vac. Sci. & Technol. A 21 (2003) S42–S53.CrossRefGoogle Scholar
[7] Jensen, DS, Kanyal, SS, Gupta, V, Vail, MA, Dadson, AE, Engelhard, M, Vanfleet, R, Davis, RC & Linford, MR J. Chrom. A 1257 (2012) 195–203.CrossRefGoogle Scholar
[8] Wang, H, Madaan, N, Bagley, J, Diwan, A, Liu, Y, Davis, RC, Lunt, BM, Smith, SJ & Linford, MR Thin Solid Films 569 (2014) 124–130.CrossRefGoogle Scholar
You have Access

Save article to Kindle

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE
Available formats
×

Save article to Dropbox

To save this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about saving content to Dropbox.

New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE
Available formats
×

Save article to Google Drive

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *