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New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE

Published online by Cambridge University Press:  25 July 2016

Matthew R. Linford ,
Bhupinder Singh ,
Daniel Velázquez ,
Jeff Terry ,
Jacob D. Bagley ,
Dennis H. Tolley ,
Anubhav Diwan ,
Varun Jain  and
Alberto Herrera-Gomez
Matthew R. Linford
Affiliation:
Departments of Chemistry and Biochemistry and
Bhupinder Singh
Affiliation:
Departments of Chemistry and Biochemistry and
Daniel Velázquez
Affiliation:
Statistics, Brigham Young University, UT, USA
Jeff Terry
Affiliation:
Statistics, Brigham Young University, UT, USA
Jacob D. Bagley
Affiliation:
Departments of Chemistry and Biochemistry and
Dennis H. Tolley
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico
Anubhav Diwan
Affiliation:
Departments of Chemistry and Biochemistry and
Varun Jain
Affiliation:
Departments of Chemistry and Biochemistry and
Alberto Herrera-Gomez
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 344 - 345
Copyright
© Microscopy Society of America 2016 

References

References:

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