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New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE

Published online by Cambridge University Press:  25 July 2016

Matthew R. Linford
Affiliation:
Departments of Chemistry and Biochemistry and
Bhupinder Singh
Affiliation:
Departments of Chemistry and Biochemistry and
Daniel Velázquez
Affiliation:
Statistics, Brigham Young University, UT, USA
Jeff Terry
Affiliation:
Statistics, Brigham Young University, UT, USA
Jacob D. Bagley
Affiliation:
Departments of Chemistry and Biochemistry and
Dennis H. Tolley
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico
Anubhav Diwan
Affiliation:
Departments of Chemistry and Biochemistry and
Varun Jain
Affiliation:
Departments of Chemistry and Biochemistry and
Alberto Herrera-Gomez
Affiliation:
CINVESTAV-Unidad Queretaro, Queretaro, Mexico
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Abstract

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Copyright
© Microscopy Society of America 2016 

References

[1] Singh, B, Diwan, A, Jain, V, Herrera-Gomez, A, Terry, J & Linford, MR Submitted to Applied Surface Science.Google Scholar
[2] Singh, B, Velázquez, D, Terry, J & Linford, MR J. Electron Spectrosc 197 (2014) 5663.CrossRefGoogle Scholar
[3] Singh, B, Velázquez, D, Terry, J & Linford, MR J. Electron Spectrosc 197 (2014) 112117.CrossRefGoogle Scholar
[4] Bagley, JD, Tolley, DH & Linford, MR Surface and Interface Analysis (2016), DOI: 10.1002/sia.5938.Google Scholar
[5] Hilfiker, JN, Singh, N, Tiwald, T, Convey, D, Smith, SM, Baker, JH & Tompkins, HG Thin Solid Films 516 (2008) 79797989.CrossRefGoogle Scholar
[6] Powell, CJ J. Vac. Sci. & Technol. A 21 (2003) S42S53.CrossRefGoogle Scholar
[7] Jensen, DS, Kanyal, SS, Gupta, V, Vail, MA, Dadson, AE, Engelhard, M, Vanfleet, R, Davis, RC & Linford, MR J. Chrom. A 1257 (2012) 195203.CrossRefGoogle Scholar
[8] Wang, H, Madaan, N, Bagley, J, Diwan, A, Liu, Y, Davis, RC, Lunt, BM, Smith, SJ & Linford, MR Thin Solid Films 569 (2014) 124130.CrossRefGoogle Scholar
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New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE
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New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE
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New Data Analysis Tools for X-ray Photoelectron Spectroscopy (XPS) and Spectroscopic Ellipsometry (SE): Uniqueness Plots and Width Functions in XPS, and Distance, Principal Component, and Cluster Analyses in SE
Available formats
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