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A Need for Bandwidth Limitations in Electron Microscopes

Published online by Cambridge University Press:  27 August 2014

Edgar Voelkl  and
Peter Tiemeijer
Edgar Voelkl
Affiliation:
FEI Company, Hillsboro, Oregon, USA
Peter Tiemeijer
Affiliation:
FEI Company, Eindhoven, Netherlands

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 944 - 945
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Leith, E.N.and Upatnieks, J. JOSA, Vol. 52, Number 10 (1962), p. 1123-1128.Google Scholar
[2] “Introduction to Electron Holography”, Voelkl, E., Allard, L.F., Joy, D.J. Kluwer Academic / Plenum Publishers (1999.Google Scholar
[3] Tang D and S Lazar are thanked for their support.Google Scholar