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A Multi-Step Transmission Electron Microscopy Sample Preparation Technique for Indented Ceramics having Extensive Sub-Surface Cracking

Published online by Cambridge University Press:  27 August 2014

C. V. Weiss Brennan ,
S. D. Walck  and
J. J. Swab
C. V. Weiss Brennan
Affiliation:
U.S. Army Research Laboratory, RDRL-WMM-E, Aberdeen Proving Ground, MD 21005, USA
S. D. Walck
Affiliation:
Bowhead Science and Technology, RDRL-WMM-C, Aberdeen Proving Ground, MD 21005, USA
J. J. Swab
Affiliation:
U.S. Army Research Laboratory, RDRL-WMM-E, Aberdeen Proving Ground, MD 21005, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1890 - 1891
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] McCaffrey, J.P., Phaneuf, M.W.andMadsen, L.D. Ultramicroscopy 87 (2001),p. 97-104.Google Scholar
[2] Chen, M., McCauley, J.W. and Hemker, K.J. Science 7 (2003), p. 1563-1566.Google Scholar
[3] The authors wish to thank Dr. Wendy Sarney, Dr. Kelvin Xie, and Dr. Jason Robinette.Google Scholar