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Motion of Gold Atoms on Carbon in the Aberration-Corrected STEM

Published online by Cambridge University Press:  21 December 2007

Philip E. Batson
Philip E. Batson
Affiliation:
IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598, USA
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Abstract

The movement of heavy atoms on a thin carbon substrate is readily observed using a sub-Ångstrom electron probe. The observed movement is consistent with an electron beam activation mechanism whereby atoms are occasionally detached from bonding sites, allowing rapid diffusion to new sites that may be quite far from the original. The bonding sites are most often observed to lie at defects, steps, and other asperities in the substrate. Formation of three-dimensional clusters can occur during diffusion of several isolated atoms. Coalescence and dissolution of larger clusters and islands both occur under varying observation conditions, but island coalescence appears most probable for islands that are greater than 2 nm in size.

Keywords

atom movementnanoparticlesaberration correctionSTEMHAADF
Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Issue 1: Special Issue: Materials Research in an Aberration-Free Environment , February 2008 , pp. 89 - 97
Copyright
© 2008 Microscopy Society of America

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References

REFERENCES

Abell, G.C. (1985). Empirical chemical pseudopotential theory of molecular and metallic bonding. Phys Rev B 31, 6184–6196.Google Scholar
Allen, L.J., Findlay, S.D., Oxley, M.P., Witte, C. & Zaluzec, N.J. (2006). Channeling effects in high-angular-resolution electron spectroscopy. Phys Rev B 73, 094104.Google Scholar
Batson, P.E. (1980). Damping of bulk plasmons in small aluminum spheres. Solid State Comm 37, 477–480.Google Scholar
Batson, P.E. (1986). High resolution electron energy loss spectrometer for the scanning transmission electron microscope. Rev Sci Instrum 57, 43–48.Google Scholar
Batson, P.E. (1988). Parallel detection for high resolution electron energy loss studies in the scanning transmission electron microscope. Rev Sci Instrum 59, 1132–1138.Google Scholar
Batson, P.E. (1993). Symmetry selected electron energy loss scattering in diamond. Phys Rev Lett 70, 1822–1825.Google Scholar
Batson, P.E. (2005). Challenges and opportunities of angstrom-level analysis. In Microscopy of Semiconducting Materials, A. Cullis, (Ed.), pp. 836–837. Oxford: Royal Microscopy Society.
Batson, P.E. (2006). Characterizing probe performance in the aberration corrected STEM. Ultramicroscopy 106, 1104–1114.Google Scholar
Batson, P.E., Dellby, N. & Krivanek, O.L. (2002). Sub-angstrom resolution using aberration corrected electron optics. Nature 418, 617–620.Google Scholar
Cleveland, C.L. & Landman, U. (1991). The energetics and structure of nickel clusters: Size dependence. J Chem Phys 94, 7376–7395.Google Scholar
Goldsmith, B.R., Coroneus, J.G., Khalap, V.R., Kane, A.A., Weiss, G.A. & Collins, P.G. (2007). Conductance-controlled point functionalization of single-walled carbon nanotubes. Science 315, 77–81.Google Scholar
Hobbs, L.W. (1979). Application of transmission electron microscopy to radiation damage in ceramics. J Am Ceram Soc 62, 1151–2916.Google Scholar
Iijima, S. (1985). Electron microscopy of small particles. J Electron Microsc 34, 249–265.Google Scholar
Jacobsen, J., Pleth Nielsen, L., Besenbacher, F., Stensgaard, I., Laegsgaard, E., Rasmussen, T., Jacobsen, K.W. & Norkov, J.K. (1995). Atomic-scale determination of misfit dislocation loops at metal-metal interfaces. Phys Rev Lett 75, 489–492.Google Scholar
Kohl, H. (1983). Image of a surface plasmon. Ultramicroscopy 11, 53.Google Scholar
Marks, L.D. (1994). Experimental studies of small particle structures. Rep Prog Phys 57, 603–649.Google Scholar
Mkhoyan, K.A., Silcox, J., Ellison, A., Ast, D. & Dieckmann, R. (2006). Full recovery of electron damage in glass at ambient temperatures. Phys Rev Lett 96, 205506.Google Scholar
Mook, H.W., Batson, P.E. & Kruit, P. (1999). Operation of the fringe field monochromator in field emission STEM. In Electron Microscopy and Analysis 1999, C. Kiely (Ed.), Vol. 161, pp. 223–226. Bristol, UK: Institute of Physics.
Muller, D.A. & Silcox, J. (1995). Delocalization in inelastic scattering. Ultramicroscopy 59, 195–213.Google Scholar
Munnix, S. & Schmeits, M. (1985). Surface-plasmon excitation on oxide-covered spherical particles. Phys Rev B 32, 4192–4200.Google Scholar
Smith, D.J., Petford-Long, A.K., Wallenberg, L.R. & Bovin, J.O. (1986). Dynamic observations of atomic-level rearrangements in small gold particles. Science 233, 872–875.Google Scholar
van Opbroek, G. & den Hartog, H.W. (1985). Radiation damage of NaCl: Dose rate effects. J Phys C 18, 257–268.Google Scholar
Zabala, N. & Rivacoba, A. (1993). Electron energy loss near supported particles. Phys Rev B 48, 14534–14542.Google Scholar