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A Method to Prepare TEM Specimens by Focused Ion Beam Milling for Cu/diamond Composites

Published online by Cambridge University Press:  01 August 2018

Luhua Wang
Affiliation:
State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing 100083, China Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
Hailong Zhang
Affiliation:
State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing 100083, China
Xitao Wang
Affiliation:
State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing 100083, China
Jinguo Wang
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
Moon J. Kim
Affiliation:
Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
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© Microscopy Society of America 2018 

References

[1] Zweben, C J. Adv. Mater. 39 2007) p. 3.Google Scholar
[2] Schubert, T, et al., Compos. Part A: Appl. Sci. Manuf. 38 2007) p. 2398.CrossRefGoogle Scholar
[3] Li, J W, et al., Scr. Mater. 109 2015) p. 72.CrossRefGoogle Scholar
[4] Giannuzzi, L A, Geurts, R Ringnalda, J Microsc. Microanal. 11(suppl 2 2005) p. 828.Google Scholar
[5] The authors acknowledge fundings from the International Science and Technology Cooperation Program of China (No. 2014DFA51610) and the Louis Beecherl, Jr Endowment Funds.Google Scholar

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