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Maximising Information from Aberration-Corrected STEM images: Applications to Plasmonic, Semiconductor and Battery Materials

  • Y Zhu (a1) (a2), H Katz-Boon (a2), CL Zheng (a1), M Walsh (a2), C Dwyer (a3), L Bourgeois (a1), R Withers (a4) and J Etheridge (a1) (a2)...
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References

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[1] Maunders, C, Dwyer, C, Tiemeijer, P & Etheridge, J, Ultramicroscopy 111 (2011) 1437.
[2] Dwyer, C, Maunders, C, Zheng, C L, Weyland, M, Tiemeijer, P & Etheridge, J., App Phys Lett 100 (2012).
[3] Zheng, C L & Etheridge, J, Ultramicroscopy 125 (2013) 49.
[4] Katz-Boon, H, et al., Nano Letts just accepted (2015). DOI: 10.1021/acs.nanolett.5b00124.
[5] Erni, R, et al. Nat. Mater. 13 (2014) 216 ; B Guiton & P Davies Nat. Mater. 13 (2014) 217.
[6] Zhu, Y, Withers, R, Bourgeois, L, Dwyer, C & Etheridge, J submitted 2015.
[7] Kauko, H, Zheng, CL, Zhu, Y, et al., App Phys Letts 103 (2013) 232111.
[8] Jiang, N, Gao, Q, Parkinson, P, Wong-Leung, J, et al., Nano Lett 13 (2013) 5135.
[9] Funding is acknowledged from the Australian Research Council Grants DP110104734, DP120101573, LE0454166. We thank A. Funston, P. Mulvaney and C. Jagadish for specimens.

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