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Mapping Non-Crystalline Nanostructure in Beam Sensitive Systems With Low-dose Scanning Electron Pair Distribution Function Analysis

Published online by Cambridge University Press:  05 August 2019

Joonatan E. M. Laulainen ,
Duncan N. Johnstone ,
Ivan Bogachev ,
Sean M. Collins ,
Louis Longley ,
Thomas D. Bennett  and
Paul A. Midgley
Joonatan E. M. Laulainen*
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, CB3 0FS, Cambridge, UK
Duncan N. Johnstone
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, CB3 0FS, Cambridge, UK
Ivan Bogachev
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, CB3 0FS, Cambridge, UK
Sean M. Collins
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, CB3 0FS, Cambridge, UK
Louis Longley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, CB3 0FS, Cambridge, UK
Thomas D. Bennett
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, CB3 0FS, Cambridge, UK
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, CB3 0FS, Cambridge, UK
*
*Corresponding author: jeml3@cam.ac.uk

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1636 - 1637
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Billinge, SJL and Levin, I, Science, 316 (2007) p. 561.Google Scholar
[2]Cockayne, DJH, Annual Review of Materials Research, 37 (2007) p. 159-187.Google Scholar
[3]Cockayne, DJH and McKenzie, DR, Acta Crystallographica Section A, 44.6 (1988) p. 870-878Google Scholar
[4]Lu, P and Gauntt, BD, Microscopy and Microanalysis, 19.2 (2013) p. 300-309.Google Scholar
[5]Mu, X et al. , Ultramicroscopy, 168 (2016) p. 1-6.Google Scholar
[6]The authors acknowledge funding from the EPSRC (Grant no. EP/R008779/1) and through doctoral training award EP/R513180/1. We thank Diamond Light Source Ltd. for access and support in the use of the electron Physical Science Imaging Centre (EM16983, EM19130, EM20195, MG21979).Google Scholar