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Mapping Electronic State Changes with STEM EBIC

Published online by Cambridge University Press:  05 August 2019

B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Toyanath Joshi
Affiliation:
Department of Physics, University of California, Santa Cruz, CA, USA.
Jared J. Lodico
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Brian T. Zutter
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Ho Leung Chan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Matthew Mecklenburg
Affiliation:
Core Center of Excellence in Nano Imaging, University of Southern California, Los Angeles, USA.
David Lederman
Affiliation:
Department of Physics, University of California, Santa Cruz, CA, USA.
William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]White, ER et al. , Applied Physics Letters 107 (2015) 223104.Google Scholar
[2]Hubbard, WA et al. , Physical Review Applied 10 (2018) 044066.Google Scholar
[3]Janninck, RF and Whitmore, DH, Journal of Physics and Chemistry of Solids 27 (1966), p. 1183.Google Scholar
[4]Joshi, T et al. , Journal of Physics D: Applied Physics 48 (2015), 335308.Google Scholar
[5]This work was supported by National Science Foundation (NSF) award DMR-1611036, by NSF Science and Technology Center (STC) award DMR-1548924 (STROBE), and by the UCLA PSEIF.Google Scholar