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Mapping Dopant Defect Complexes at the Nano and Atomic Scale for Quantum Computing

Published online by Cambridge University Press:  30 July 2020

Matthew Hauwiller ,
Abinash Kumar  and
James LeBeau
Matthew Hauwiller
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Abinash Kumar
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
James LeBeau
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States

Abstract

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Type
Advances in Microscopy for Quantum Information Sciences - Single Atom
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2562 - 2564
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Copyright
Copyright © Microscopy Society of America 2020

References

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