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Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy

  • Matthew Weyland (a1) (a2), Zhen Chen (a3), Adrian J. D’Alfonso (a4), Yuman Zhu (a2), Nikhil V. Medhekar (a2), Christian Dwyer (a5), Daniel J. Taplin (a3), Scott D. Findlay (a3) and Leslie J. Allen (a4)...
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References

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[1] LeBeau, JM, et al, PRL 100 (2008) 206101.
[2] Dwyer, C, et al, APL 100 (2012) 191915.
[3] Zhu, Y, et al, Scripta Materialia 101 (2015). p. 16.
[4] Chen, Z, et al, Ultramicroscopy 157 (2015). p. 21.
[5] The authors wish to thank Ye Zhu (Monash), Nestor Zaluzec (Argonne) and Alan Sandbog (EDAX). This work was supported by the Australian Research Council (Projects DP110102228, DP140102538, DE130100739 and LE0454166) and the Monash Centre for Electron Microscopy.

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