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Low-Voltage TEM/STEM for Imaging and Spectroscopy of Low-Dimensional Materials

Published online by Cambridge University Press:  04 August 2017

Kazu Suenaga
Kazu Suenaga*
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, JapanAffiliation

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 458 - 459
Copyright
© Microscopy Society of America 2017 

References

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[8] The 3C project was supported by JST CREST and ACCEL programs. This work is a collaboration with H. Sawada, T. Sasaki, S. Morishita and M. Mukai (JEOL). The applications were conducted by YC Lin, J. Lin, L. Tizei and R. Senga (AIST). The authors acknowledge K. Kimoto for conducting the project.Google Scholar