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Low Energy BSE Imaging with a New Scintillation Detector

Published online by Cambridge University Press:  23 September 2015

J. Kolosova ,
J. Jiruse ,
J. Fiala  and
J. Beranek
J. Kolosova
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.
J. Jiruse
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.
J. Fiala
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.
J. Beranek
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 703 - 704
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Bell, DC Erdman, N in "Low Voltage Electron microscopy: Principles and Applications" ed. DC BellN Erdman John Wiley & Sons Chichester p. 1 Google Scholar
[2] Frank, L et al Materials 5 2012 p. 2731 CrossRefGoogle Scholar
[4] Jiruse, J et al Microscopy and Microanalysis 20 2014 p. 990 CrossRefGoogle Scholar