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Local Structure Characterization in Nanomaterials using Aberration Corrected STEM

Published online by Cambridge University Press:  05 August 2007

K van Benthem ,
S-H Oh ,
M Oxley ,
S Rashkeev ,
A Marinopoulos ,
R Buzcko ,
ST Pantelides  and
S Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory
S-H Oh
Affiliation:
Oak Ridge National Laboratory
M Oxley
Affiliation:
Oak Ridge National Laboratory
S Rashkeev
Affiliation:
Oak Ridge National Laboratory
A Marinopoulos
Affiliation:
Vanderbilt University
R Buzcko
Affiliation:
Oak Ridge National Laboratory
ST Pantelides
Affiliation:
Oak Ridge National Laboratory
S Pennycook
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1182 - 1183
Copyright
© 2007 Microscopy Society of America

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