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Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector

  • Kenji Tsuda (a1), Ryusuke Sagawa (a2), Hiroki Hashiguchi (a2) and Yukihito Kondo (a2)
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Copyright

Corresponding author

*Corresponding author: k_tsuda@tohoku.ac.jp

References

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[1]Tanaka, M and Tsuda, K, J. Electron Microsc. 60 (S1) (2011), p. S245.
[2]Tsuda, K and Tanaka, M, Acta Cryst. A55 (1999), p. 939.
[3]Ogata, Y, Tsuda, K and Tanaka, M, Acta. Cryst. A64 (2008), p. 587.
[4]Tsuda, K et al. , Phys. Rev. B 81 (2010), p. 180102.
[5]Tsuda, K., Yasuhara, A and Tanaka, M, Appl. Phys. Lett. 102 (2013), p. 051913.
[6]Tsuda, K and Tanaka, M, Appl. Phys. Express 8, (2015), p. 081501.
[7]Tsuda, K and Tanaka, M, Appl. Phys. Express 9 (2016), p. 071501.
[8]Tsuda, K and Tanaka, M, Jpn. J. Appl. Phys. 56 (2017), p. 10PB09.
[9]Cochran, W, Adv. Phys. 9 (1960), p. 387.
[10]Sagawa, R et al. , Microsc. Microanal. 23 (S1) (2017), p. 52.
[11]An author (KT) is grateful to Emer. Prof. Michiyoshi Tanaka and Prof. Masami Terauchi for their stimulating discussion and support.

Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector

  • Kenji Tsuda (a1), Ryusuke Sagawa (a2), Hiroki Hashiguchi (a2) and Yukihito Kondo (a2)

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