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Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector

Published online by Cambridge University Press:  05 August 2019

Kenji Tsuda ,
Ryusuke Sagawa ,
Hiroki Hashiguchi  and
Yukihito Kondo
Kenji Tsuda*
Affiliation:
Frontier Institute for Interdisciplinary Research, Tohoku University, Sendai, Japan.
Ryusuke Sagawa
Affiliation:
JEOL Ltd., Tokyo, Japan.
Hiroki Hashiguchi
Affiliation:
JEOL Ltd., Tokyo, Japan.
Yukihito Kondo
Affiliation:
JEOL Ltd., Tokyo, Japan.
*
*Corresponding author: k_tsuda@tohoku.ac.jp

Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1996 - 1997
Copyright
Copyright © Microscopy Society of America 2019 

References

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[11]An author (KT) is grateful to Emer. Prof. Michiyoshi Tanaka and Prof. Masami Terauchi for their stimulating discussion and support.Google Scholar