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Local Phase Curvature Measurement in STEM With a Pixelated Detector

Published online by Cambridge University Press:  05 August 2019

Matus Krajnak*
Affiliation:
Department of Materials Science and Engineering, Monash University, Victoria 3800, Australia
David M Paganin
Affiliation:
School of Physics and Astronomy, Monash University, Victoria 3800, Australia
Kayla Fallon
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow, G12 8QQ, UK
Stephen McVitie
Affiliation:
SUPA, School of Physics and Astronomy, University of Glasgow, Glasgow, G12 8QQ, UK
Joanne Etheridge
Affiliation:
Department of Materials Science and Engineering, Monash University, Victoria 3800, Australia Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia
*
*Corresponding author: matus@quantumdetectors.com

Abstract

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Type
Advances in Phase Retrieval Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

Current address Quantum Detectors ltd, Harwell Oxford OX11 0QX, UK

References

[1]Pennycook, TJ, et al. , Ultramicroscopy 151 (2015), p. 160.Google Scholar
[2]Krajnak, M, et al. , Ultramicroscopy 165 (2016), p. 42.Google Scholar
[3]Müller, K, et al. , Nature communications 5 (2014), p. 5653.Google Scholar
[4]Wu, M, Spiecker, E, Ultramicroscopy 176 (2017), p. 233.Google Scholar
[5]Clark, L, et al. , Physical Review A 97 (2018), p. 043843.Google Scholar
[6]Quantum Detectors, https://quantumdetectors.com/n/products/merlinem/ (accessed Feb 13, 2019).Google Scholar
[7]McVitie, S, et al. , Ultramicroscopy 152 (2015), p. 57.Google Scholar
[8]PixelatedDPC, https://github.com/matkraj/pixelatedDPC (accessed Feb 13, 2019).Google Scholar
[9]The authors acknowledge ARC grant DP150104483, Core 2 Core UK/Japan EPSRC grant EP/M024412/1. Authors are also grateful for Ni80Fe20 sample made by Azzawi Sinan and Del Atkinson from University of Durham, UK.Google Scholar