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Lattice-Vibration Limited Resolution, 3D Depth Sectioning and High Dose-Efficient Imaging via Multislice Electron Ptychography

Published online by Cambridge University Press:  22 July 2022

Zhen Chen ,
Yi Jiang ,
Yu-Tsun Shao ,
Megan E. Holtz ,
Michal Odstrčil ,
Manuel Guizar-Sicairos ,
Isabelle-Mercedes Schulze-Jonack ,
Steffen Ganschow ,
Darrell G. Schlom  and
David A. Muller
Zhen Chen*
Affiliation:
School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
Megan E. Holtz
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA
Michal Odstrčil
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Manuel Guizar-Sicairos
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Isabelle-Mercedes Schulze-Jonack
Affiliation:
Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany
Steffen Ganschow
Affiliation:
Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany
Darrell G. Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853, USA Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853, USA
*
*Corresponding author: zhenchen01@tsinghua.edu.cn

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 376 - 378
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Copyright
Copyright © Microscopy Society of America 2022

References

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Research supported by US NSF (grants DMR-2039380 and DMR-1719875).Google Scholar