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Is Microanalysis Possible in the Helium Ion Microscope?

Published online by Cambridge University Press:  08 July 2011

David C. Joy  and
Brendan J. Griffin
David C. Joy*
Affiliation:
Electron Microscopy Facility, University of Tennessee, Knoxville, TN 37996-0840, USA Center for NanoPhase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6496, USA
Brendan J. Griffin
Affiliation:
Center for NanoPhase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6496, USA Centre for Microscopy, Characterization and Analysis (M010), University of Western Australia, Crawley, WA 6009, Australia
*
Corresponding author. E-mail: djoy@utk.edu
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Abstract

Because the ability to perform some form of chemical microanalysis has become an essential feature for any microscope, it is necessary to investigate what options are available in the new “ORION” helium ion microscope (HIM). The HIM has the ability to visualize local variations in specimen chemistry in both the ion induced secondary electron and the Rutherford backscattered imaging modes, but this provides only limited and qualitative information. Quantitative, elementally specific, microanalysis could be performed in the HIM using secondary electron spectroscopy, Rutherford backscattered ion spectroscopy, or secondary ion mass spectroscopy, but while each of these options has promise, none of them can presently guarantee either reliable element identification or quantitative analysis across the periodic table.

Keywords

microanalysision beamssecondary electronsRutherford backscatterSIMS
Type
Helium Ion Microscopy
Information
Microscopy and Microanalysis , Volume 17 , Issue 4 , August 2011 , pp. 643 - 649
Copyright
Copyright © Microscopy Society of America 2011

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References

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