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Investigation of the Embrittlement of Bi Doped Cu Bicrystals by Aberration-Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  09 October 2013

C.A. Wade ,
L. Giannuzzi ,
A. Herzing ,
M. McLean ,
R. Vinci  and
M. Watanabe
C.A. Wade
Affiliation:
L. Giannuzzi
Affiliation:
A. Herzing
Affiliation:
M. McLean
Affiliation:
R. Vinci
Affiliation:
M. Watanabe
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1738 - 1739
Copyright
Copyright © Microscopy Society of America 2013