Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-19T11:15:41.962Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigation of Multiple, Large Area EDS Detectors on an SEM Capable of Various Mounting Geometries for Optimal EDS Analysis

Published online by Cambridge University Press:  27 August 2014

D. Edwards ,
N. Rowlands ,
D. Guarrera ,
N. Erdman ,
V. Robertson  and
R. McLaughlin
D. Edwards
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
N. Rowlands
Affiliation:
Oxford Instruments, Suite 150, 300 Baker Ave., Concord, MA 01742
D. Guarrera
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
N. Erdman
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
V. Robertson
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
R. McLaughlin
Affiliation:
Oxford Instruments, Suite 150, 300 Baker Ave., Concord, MA 01742

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 646 - 647
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Newbury, D.E, Ritchie, N.W.M Journal of Analytical Atomic Spectrometry 28.7 (2013): 973-988.Google Scholar
[2] Bell, D.C. and Erdman, N. in Low Voltage Electron Microscopy: Principles and Applications (2012):1-30.Google Scholar
[3] Rowlands, N., et al., Microscopy and Microanalysis 15.S2 (2009): 548-54.Google Scholar