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In-Situ Liquid Phase Electron Microscopy of Beam-Sensitive Materials

  • Hanglong Wu (a1) (a2), Alessandro Ianiro (a3) (a2), Mark M. J. van Rijt (a1) (a2), Arthur D. A. Keizer (a1) (a2), A. Catarina C. Esteves (a3) (a2), Remco Tuinier (a3) (a2), Heiner Friedrich (a1) (a2), Nico. A.J.M. Sommerdijk (a1) (a2) and Joseph P. Patterson (a1) (a2)...
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Abstract

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References

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[1]De Jonge, N and Ross, FM, Nature Nanotechnology 6 (2016), p. 695.
[2]De Yoreo, JJ and Sommerdijk, NAJM, Nature Reviews Materials 1 (2016), p. 16035.
[3]Ross, FM, Science 350 (2015), p. 6267.
[4]Yuk, JM et al. , Science 336 (2012), p. 61.
[5]Smeets, PJ et al. , Nature Materials 14 (2015), p. 394.
[6]Patterson, JP et al. , Journal of the American Chemical Society 137 (2015), p. 7322.
[7]Parent, LR et al. , Accounts of Chemical Research 51 (2018), p. 3.

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