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In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

  • M. Jablonski (a1), C.R. Winkler (a1), M.L. Taheri (a1), A.R. Damodaran (a2), J. Karthik (a2), J.G. Wen (a3) and D.J. Miller (a3)...

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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In-situ and Ex-situ TEM Characterization of Domain Wall-Defect Interactions Using Applied DC Bias in Bismuth Ferrite Thin Films

  • M. Jablonski (a1), C.R. Winkler (a1), M.L. Taheri (a1), A.R. Damodaran (a2), J. Karthik (a2), J.G. Wen (a3) and D.J. Miller (a3)...

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