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Information-tagged Data-acquisition System for On-the-fly Scanning

Published online by Cambridge University Press:  10 August 2018

Chien-Yu Lee*
Affiliation:
National Synchrotron Radiation Research Center
Gung-Chian Yin
Affiliation:
National Synchrotron Radiation Research Center
Bo-Yi Chen
Affiliation:
National Synchrotron Radiation Research Center
Huang-Yeh Chen
Affiliation:
National Synchrotron Radiation Research Center
Bi-Hsuan Lin
Affiliation:
National Synchrotron Radiation Research Center
Shao-Chin Tseng
Affiliation:
National Synchrotron Radiation Research Center
Shi-Hung Chang
Affiliation:
National Synchrotron Radiation Research Center
Xiao-Yun Li
Affiliation:
National Synchrotron Radiation Research Center
Mau-Tsu Tang
Affiliation:
National Synchrotron Radiation Research Center
*
* Corresponding author, lee.cy@nsrrc.org.tw

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Yin, G.-C., et al, AIP Conference Proceedings 1696 2016 020026.CrossRefGoogle Scholar
[2] Yin, G.-C., et al, Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II 959204.Google Scholar
[3] Lin, B.-H., et al, Applied Physics Letters 109, 192104 2016.CrossRefGoogle Scholar
[4] Lin, B.-H., et al, Optics express 26, 27312739, 2018.CrossRefGoogle Scholar