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Influence of Surfactant Concentration on the Surface Morphology of Hollow Silica Microspheres and Its Explanation

Published online by Cambridge University Press:  13 September 2011

Shiquan Liu ,
Meiying Wei ,
Pegie Cool ,
Cynthia Van Oers  and
Jiancun Rao
Shiquan Liu*
Affiliation:
School of Materials Science and Engineering, University of Jinan, Jinan, Shandong 250022, China
Meiying Wei
Affiliation:
School of Materials Science and Engineering, University of Jinan, Jinan, Shandong 250022, China
Pegie Cool
Affiliation:
Laboratory of Adsorption and Catalysis, University of Antwerp, Wilrijk 2610, Antwerp, Belgium
Cynthia Van Oers
Affiliation:
Laboratory of Adsorption and Catalysis, University of Antwerp, Wilrijk 2610, Antwerp, Belgium
Jiancun Rao
Affiliation:
Department of Materials Science, Harbin Institute of Technology, Harbin, Heilongjiang 150001, China
*
Corresponding author. E-mail: vctrliu@hotmail.com
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Abstract

The surface morphology of hollow silica microspheres has influence on their applications. After a thorough investigation of the deposition of silica nanoparticles on polystyrene (PS) beads and the surface morphology and texture of the resultant hollow silica shells with scanning electron microscopy, transmission electron microscopy, and N2-sorption measurements, the influence of surfactant [cetyltrimethylammonium bromide (CTAB)] concentration on the surface morphology of hollow silica microspheres templated by PS beads is explained. Previously, CTAB was believed to turn the surface charge of PS beads from negative into positive so that negatively charged silica could be deposited on the PS template. Here, we show CTA+ cations preferentially assemble with silica species to form silica-CTA+ composite nanoparticles. Since the zeta potential of silica-CTA+ composite nanoparticles is smaller than that of pure silica nanoparticles, these composite nanoparticles encounter less repulsion when they are deposited on the surface of PS beads and close to each other. As more CTAB is added, the silica-CTA+ nanoparticles are less negatively charged, and more compact and smooth hollow silica microspheres are obtained.

Keywords

electron microscopysurface morphologyhollow silica microspheresurfactant
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 17 , Issue 5 , October 2011 , pp. 766 - 771
Copyright
Copyright © Microscopy Society of America 2011

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