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In situ TEM Observations of Thermally Activated Phenomena in Materials Under Far-From-Equilibrium Conditions

Published online by Cambridge University Press:  22 July 2022

Sriram Vijayan ,
Kaustubh Bawane ,
Fidelma Giulia Dilemma ,
Lingfeng He ,
Carolin Fink  and
Joerg R Jinschek
Sriram Vijayan*
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, Ohio, USA
Kaustubh Bawane
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, USA
Fidelma Giulia Dilemma
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, USA
Lingfeng He
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, USA
Carolin Fink
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, Ohio, USA
Joerg R Jinschek
Affiliation:
National Center for Nano Fabrication and Characterization (DTU Nanolab), Technical University of Denmark (DTU), Kgs. Lyngby, Denmark
*
*Corresponding author: vijayan.13@osu.edu

Abstract

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Type
In Situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1844 - 1846
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Copyright
Copyright © Microscopy Society of America 2022

References

Vijayan, S, PhD Theses, 2018, University of Connecticut.Google Scholar
Vijayan, S et al. , J. Mater. Sci. 54 (2019), p. 9921.CrossRefGoogle Scholar
Leonard, H et al. , Mater. Charact. 178 (2021), p. 111239.CrossRefGoogle Scholar
Vijayan, S and Aindow, M, Ultramicroscopy 196 (2019), p. 142.CrossRefGoogle Scholar
Vijayan, S et al. , Microsc. Res. Techn. (2021) p. 1.Google Scholar
Vijayan, S et al. , Microsc. & Microanal., 23 (2017), p. 708.CrossRefGoogle Scholar
Young, GA et al. , Welding Journal 87 (2008), p. 31.Google Scholar
Hofman, GL et al. , J. Nucl. Mater., 227 (1996), p. 277.CrossRefGoogle Scholar
Shao, M et al. , Mater. & Des., 196 (2020), p. 109165.CrossRefGoogle Scholar
The authors acknowledge funding from Office of Naval Research (ONR), MURI grant 102359, and by the LDRD program at Idaho National Laboratory (INL)Google Scholar