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In Situ TEM Observation of Solid Electrolyte Interface Using High Speed Direct Electron Camera

Published online by Cambridge University Press:  27 August 2014

Liang Jin
Affiliation:
Bilhorn Direct Electron, LP, 13240 Evening Creek Drive S., Suite 311, San Diego, CA 92128, USA
Benjamin E. Bammes
Affiliation:
Bilhorn Direct Electron, LP, 13240 Evening Creek Drive S., Suite 311, San Diego, CA 92128, USA
Dong-Hua Chen
Affiliation:
Bilhorn Direct Electron, LP, 13240 Evening Creek Drive S., Suite 311, San Diego, CA 92128, USA
Michael S. Spilman
Affiliation:
Bilhorn Direct Electron, LP, 13240 Evening Creek Drive S., Suite 311, San Diego, CA 92128, USA
B. Robert
Affiliation:
Bilhorn Direct Electron, LP, 13240 Evening Creek Drive S., Suite 311, San Diego, CA 92128, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

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[4] Zeng, Z., Liang, W.I., Liao, H.G., et al., Nano letters, accepted (2014).Google Scholar
[5] Christensen, J., et al., J. Electrochem. Soc., 151 (2004).Google Scholar