Skip to main content Accessibility help
×
Home

In situ TEM Measurements of Ion Irradiation Induced Creep

  • Gowtham S. Jawaharram (a1), Christopher Barr (a2), Patrick Price (a2), Khalid Hattar (a2) and Shen J. Dillon (a1)...
    • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      In situ TEM Measurements of Ion Irradiation Induced Creep
      Available formats
      ×

      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

      In situ TEM Measurements of Ion Irradiation Induced Creep
      Available formats
      ×

      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

      In situ TEM Measurements of Ion Irradiation Induced Creep
      Available formats
      ×

Abstract

  • An abstract is not available for this content so a preview has been provided below. To view the full text please use the links above to select your preferred format.

Copyright

Corresponding author

*Corresponding author: sdillon@illinois.edu

References

Hide All
[1]Garner, FA, Toloczko, MB and Sencer, BH, J. Nucl. Mater. 276 (2000), p. 123.
[2]Kelly, BT and Brocklehurst, JE, J. Nucl. Mater. 65(1) (1977), p. 79.
[3]Chen, J et al. , J. Nucl. Mater. 386-388 (2009), p. 143.
[4]Jung, P, Journal of Nuclear Materials. 200(1) (1993), p. 138.
[5]Xu, C and Was, GS, J. Nucl. Mater. 459 (2015), p. 183.
[6]OzerInc, S, Averback, RS and King, WP, JOM. 68(11) (2016), p. 2737.
[7]Ozerinc, S et al. , J. Appl. Phys.. 117(2) (2015), p. 024310/1.
[8]Tai, K et al. , J. Nucl. Mater. 422 (2012), p. 8.
[9]Lapouge, P et al. , J. Nucl. Mater. 476 (2016), p. 20.
[10]Dillon, SJ et al. , J. Nucl. Mater. 490 (2017), p. 59.
[11]Jawaharram, GS et al. , Scr. Mater. 148 (2018), p. 1.
[12]This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government. G.J. and S.J.D. would like to acknowledge US DOE Office of Basic Energy Sciences, under Grant DEFG02-05ER46217.

In situ TEM Measurements of Ion Irradiation Induced Creep

  • Gowtham S. Jawaharram (a1), Christopher Barr (a2), Patrick Price (a2), Khalid Hattar (a2) and Shen J. Dillon (a1)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed