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In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry

Published online by Cambridge University Press:  01 August 2018

Santhana Eswara
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Dept., Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Lluis Yedra
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Dept., Luxembourg Institute of Science and Technology, Belvaux, Luxembourg CentraleSupelec, France
Alisa Pshenova
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Dept., Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Varun Sarbada
Affiliation:
Dept. of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY
Jean-Nicolas Audinot
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Dept., Luxembourg Institute of Science and Technology, Belvaux, Luxembourg
Robert Hull
Affiliation:
Dept. of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY
Tom Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Dept., Luxembourg Institute of Science and Technology, Belvaux, Luxembourg

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Wirtz, T., et al, Nanotechnology 26 2015) p. 434001.Google Scholar
[2] Yedra, L., et al, Sci. Rep. 6 2016) p. 28705.Google Scholar
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[5] This work is co-funded by FNR (Luxembourg) through project grant INTER/SNF/16/11536628. We acknowledge Andrew Kercher and Dr. Nancy Dudney at Oak Ridge National Laboratory, TN, USA for the synthesis of LiVsOs thin films cathodes as a part of work supported by Center for Mesoscale Transport Properties, an Energy Frontier Research Center supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, under award #DE-SC0012673.Google Scholar