Improving the Accuracy of Orientation Measurements using EBSD

K. Thomsen; N.H. Schmidt; A. Bewick; K. Larsen; J. Goulden

doi:10.1017/S1431927613005618

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Improving the Accuracy of Orientation Measurements using EBSD

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