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Improving Data from Electron Backscatter Diffraction Experiments using Pattern Matching Techniques

Published online by Cambridge University Press:  22 July 2022

Pat Trimby ,
Kim Larsen ,
Michael Hjelmstad ,
Aimo Winkelmann  and
Klaus Mehnert
Pat Trimby*
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, HP12 3SE, UK
Kim Larsen
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, HP12 3SE, UK
Michael Hjelmstad
Affiliation:
Oxford Instruments America, Inc., Pleasanton, CA, USA
Aimo Winkelmann
Affiliation:
ST Development GmbH, Paderborn, Germany
Klaus Mehnert
Affiliation:
ST Development GmbH, Paderborn, Germany
*
*Corresponding author: pat.trimby@oxinst.com

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 3182 - 3183
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Copyright
Copyright © Microscopy Society of America 2022

References

Krieger Lassen, N.C. et al. , Scanning Microsc. 6, (1992), 115-121.Google Scholar
Winkelmann, A., et al. , Ultramicroscopy, 107 (2007), 414-421.CrossRefGoogle Scholar
Chen, Y.H. et al. , Microsc. Microanal. 21 (2015), 739-752.CrossRefGoogle Scholar
Winkelmann, A. and Nolze, G., Applied Physics Letters 106 (2015) 072101CrossRefGoogle Scholar