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Improved Characterization of Steel Samples by SEM/EDS Through the Use of a Silicon Drift Detector
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 78 - 79
- Copyright
- © Microscopy Society of America 2017
References
[4]
Newbury, D. E. & Ritchie, N. W. M.
Materials Science and Technology
2016
1017–1023.Google Scholar