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Immuno-EM in Buffer Using the Atmospheric Scanning Electron Microscope (ASEM)

Published online by Cambridge University Press:  08 April 2017

C Sato
Affiliation:
National Institute of Advanced Industrial Science and Technology, Japan
Y Maruyama
Affiliation:
National Institute of Advanced Industrial Science and Technology, Japan
T Ebihara
Affiliation:
National Institute of Advanced Industrial Science and Technology, Japan
K Mio
Affiliation:
National Institute of Advanced Industrial Science and Technology, Japan
S Manaka
Affiliation:
National Institute of Advanced Industrial Science and Technology, Japan
H Nishiyama
Affiliation:
JEOL Ltd, Japan
M Suga
Affiliation:
JEOL Ltd, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2011