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Imaging Plant Using Time-of-Flight Secondary Ion Mass Spectrometry
Published online by Cambridge University Press: 01 August 2018
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1332 - 1333
- Copyright
- © Microscopy Society of America 2018
References
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[4] We acknowledge support from the PNNL Laboratory Directed Research and Development fund and instrument access to the DOE BER EMSL user facility under the general user proposal 50093.Google Scholar
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