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Imaging in Liquids through Ultra-thin Membranes: A Comparative Analysis of Scanning Electron and Scanning Microwave Microscopies

Published online by Cambridge University Press:  25 July 2016

Alexander Tselev
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831,
Jeyavel Velmurugan
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899 Maryland Nano Center, University of Maryland, College Park, MD 20742
Andrei Kolmakov
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899
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Abstract

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© Microscopy Society of America 2016 

References

[1] Lai, K., et al, Review of Scientific Instruments vol. 78 (2007). p. 063702.CrossRefGoogle Scholar
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[4] Tselev, A. & Kolmakov, A. Microwave Conference (EuMC), 2015 European (2015). pp 662665.CrossRefGoogle Scholar
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[11] The research was supported in part through Scientific User Facilities Division (ORNL), Office of Basic Energy Sciences, U. S. Department of Energy, U.S. Civilian Research and Development Foundation and NIST-CNST/UMD-IREAP Cooperative Agreement.Google Scholar
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Imaging in Liquids through Ultra-thin Membranes: A Comparative Analysis of Scanning Electron and Scanning Microwave Microscopies
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