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Imaging Defects in Nanometer-scale Semiconductor Crystals: Statistical Nucleation Events are Few in Small Crystals, but can Control Growth

Published online by Cambridge University Press:  01 August 2005

W J MoberlyChan ,
G Seryogin ,
I Shalish ,
C-Y Wen ,
S-F Hu ,
X-J Guo ,
V Narayanamurti  and
F Spaepen
W J MoberlyChan
Affiliation:
Harvard University
G Seryogin
Affiliation:
Harvard University
I Shalish
Affiliation:
Harvard University
C-Y Wen
Affiliation:
Harvard University
S-F Hu
Affiliation:
National Nano-Devices Laboratories,Taiwan
X-J Guo
Affiliation:
Institute of Physics,Taiwan
V Narayanamurti
Affiliation:
Harvard University
F Spaepen
Affiliation:
Harvard University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1622 - 1623
Copyright
© 2005 Microscopy Society of America