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Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques

Published online by Cambridge University Press:  09 October 2013

J. Poplawsky
Affiliation:
C. Li
Affiliation:
N. Paudel
Affiliation:
Y. Yan
Affiliation:
S. Pennycook
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013