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Identification of SiC Crystals Based on 3D Reconstruction Using EBSD Technique

Published online by Cambridge University Press:  01 August 2018

Ming Han  and
Guangming Zhao
Ming Han
Affiliation:
School of Materials Science and Engineering, East China Jiaotong University, Jiangxi, China.
Guangming Zhao
Affiliation:
School of Materials Science and Engineering, East China Jiaotong University, Jiangxi, China.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 674 - 675
Copyright
© Microscopy Society of America 2018 

References

[1] Cheung, R. in Silicon Carbide Microelectromechanical Systems for Harsh Environments, R. Cheung Imperial College Press. p. 3.Google Scholar
[2] Kelly, J.F., Fisher, G.R. Barnes, P. Mater. Res. Bull. 40 2005) p. 249.Google Scholar
[3] Capitani, G.C., Pierro, S.D. Tempesta, G. Am. Mineral. 92 2007) p. 403.Google Scholar
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[5] <underline>https://en.wikipedia.org/wiki/Polymorphs_of_silicon_carbide</underline>.https://en.wikipedia.org/wiki/Polymorphs_of_silicon_carbide.>Google Scholar
[6] This work is supported by the Natural Science Foundation of China under grant No. 51071125, and Major Project of Natural Science Foundation of Jiangxi Province under grant No. 20161ACB20010. Dr. Gert Nolze is thanked for kindly supplying the experimental EBSD patterns.Google Scholar