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How sharp are atomically sharp high-Tc La2CuO4 interfaces?

Published online by Cambridge University Press:  30 July 2021

Y. Eren Suyolcu ,
Yu-Mi Wu ,
Gideok Kim ,
Georg Christiani ,
Bernhard Keimer ,
Gennady Logvenov  and
Peter A. van Aken
Y. Eren Suyolcu
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
Yu-Mi Wu
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Gideok Kim
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, Stuttgart, Baden-Wurttemberg, Germany
Georg Christiani
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Bernhard Keimer
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, Baden-Wurttemberg, Germany
Gennady Logvenov
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, United States
Peter A. van Aken
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany, Germany

Abstract

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Type
Quantum Materials Probed by High Spatial and Energy Resolution in Scanning/Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 700 - 701
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Suyolcu, Y. E. et al. , J. Supercond. Nov. Magn. 33 (2020), p. 107.CrossRefGoogle Scholar
Gozar, A. et al. , Nature 455 (2008), p. 782.CrossRefGoogle Scholar
Suyolcu, Y. E. et al. , Scientific Reports 7 (2017), p. 453CrossRefGoogle Scholar
Baiutti, F, et al. , ACS Appl. Mater. Interfaces 8 (2016), p. 27368.Google ScholarPubMed
Baiutti, F. et al. Nanoscale 10, (2018), p. 8712.CrossRefGoogle Scholar
Kaya, P. et al. , ACS Appl. Mater. Interfaces 10 (2018), p. 22786.Google Scholar
Kim, G. et al. , Phys. Rev. Mater. 3 (2019), p. 084420.Google Scholar
Wang, Y., et al. , Ultramicroscopy 168 (2016), p. 46.CrossRefGoogle Scholar
Wang, Y., et al. , Microscopy 67 (2018), p. i-114.CrossRefGoogle Scholar
This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No. 823717 – ESTEEM3.Google Scholar